DOI:
Authors:
U. Boesenberg, G. Ansaldi, A. Bartmann, Lewis Batchelor, Felix Brausse, J. Hallmann, W. Jo, Chan Kim, B. Klein, I. Lobato, Wei Lu, J. Möller, Ilia Petrov, A. Rodriguez-Fernandez, Andreas Schmidt, M. Scholz, R. Shayduk, K. Sukharnikov, A. Zozulya, Anders Madsen
Abstract:
The multipurpose diagnostic end-station (DES) at the Materials Imaging and Dynamics (MID) instrument at the European X-ray Free-Electron Laser Facility (EuXFEL) is described in detail and some exemplary beam diagnostic results are provided. Among other features, the DES is a key tool for alignment and the integrated bent-diamond crystal spectrometer enables pulse-resolved spectral characterization of the EuXFEL X-ray beam.